Single stuck-at-faults detection using test generation vector and deep stacked-sparse-autoencoder
نویسندگان
چکیده
منابع مشابه
A Method of Test Generation for Path Delay Faults Using Stuck-at Fault Test Generation Algorithms
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ژورنال
عنوان ژورنال: SN Applied Sciences
سال: 2020
ISSN: 2523-3963,2523-3971
DOI: 10.1007/s42452-020-03460-0